Atomic Force Microscopy
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portes grátis
Atomic Force Microscopy
West, Paul; Eaton, Peter
Oxford University Press
06/2018
258
Mole
Inglês
9780198826286
15 a 20 dias
544
Descrição não disponível.
1: Introduction
2: Instrumental Aspects of AFM
3: AFM Modes
4: Measuring AFM Images
5: Image Processing in AFM
6: Image Artifacts in AFM
7: Applications of AFM
Appendix 1: AFM Standards and Calibration Specimens
Appendix 2: AFM Software
2: Instrumental Aspects of AFM
3: AFM Modes
4: Measuring AFM Images
5: Image Processing in AFM
6: Image Artifacts in AFM
7: Applications of AFM
Appendix 1: AFM Standards and Calibration Specimens
Appendix 2: AFM Software
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
1: Introduction
2: Instrumental Aspects of AFM
3: AFM Modes
4: Measuring AFM Images
5: Image Processing in AFM
6: Image Artifacts in AFM
7: Applications of AFM
Appendix 1: AFM Standards and Calibration Specimens
Appendix 2: AFM Software
2: Instrumental Aspects of AFM
3: AFM Modes
4: Measuring AFM Images
5: Image Processing in AFM
6: Image Artifacts in AFM
7: Applications of AFM
Appendix 1: AFM Standards and Calibration Specimens
Appendix 2: AFM Software
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
